Jelight Blak-Ray B-100Y

is a high-intensity 100 W yellow inspection lamp designed for semiconductor wafer inspection, surface-particle detection, and other demanding visual examination applications. A specialized yellow filter blocks wavelengths below 500 nm while transmitting strong mercury emission lines at 543, 574, and 576 nm for enhanced visibility of fine surface contamination.

Applications

Semiconductor Wafer Inspection

The B-100Y provides concentrated yellow illumination for inspecting semiconductor wafers and other precision surfaces where small particles, contamination, and surface imperfections must be visually identified.

Surface Particle Detection

The filtered yellow output enhances the visibility of fine particles and surface contamination, with particles approximately 10 µm in size routinely detectable under suitable inspection conditions.

Cleanroom and Contamination Inspection

The lamp can support visual contamination checks on precision components, substrates, and work surfaces in semiconductor, electronics, cleanroom, and controlled manufacturing environments.

Quality Control and Precision Manufacturing

The high-intensity filtered light source is suitable for quality-control inspection, component examination, and manufacturing processes requiring enhanced visibility of small surface particles and defects.

Features

• High-intensity 100 W lamp designed for wafer and surface inspection.
• Yellow filter blocks wavelengths below 500 nm.
• Strong mercury emission lines at 543, 574, and 576 nm.
• Designed to enhance visibility of fine particles and surface contamination.
• Particles approximately 10 µm in size can routinely be observed under suitable inspection conditions.
• Lamp head can be removed from the transformer base for handheld inspection.
• Lamp head rotates through 360° when mounted for adjustable hands-free positioning.

Specifications

Available Variants

Optional Accessories

• Jelight B-100 Exposure Box
• Jelight 100W Bulb for B-100 Series Lamps

FAQs

How small a particle can be detected with the B-100Y?

Under suitable inspection conditions, particles approximately 10 µm in size can routinely be observed. Actual visibility depends on the surface, particle characteristics, viewing conditions, and inspection setup.

Can the B-100Y and B-100YP be used handheld?

Yes. The lamp head can be removed from the transformer base for handheld inspection or mounted in the base and rotated through 360° for adjustable hands-free use.

How does the B-100YP differ from the B-100Y?

The B-100YP uses a larger heat-resistant Cool-Touch plastic lamp housing, while the B-100Y uses the traditional aluminum lamp head. Their primary inspection function and filtered yellow spectral output are the same.

Warranty

The Jelight Blak-Ray B-100Y High-Intensity Yellow Wafer Inspection Lamp is warranted against defects in materials and workmanship under normal use and service. Please inspect all protective equipment before each use. For warranty assistance, replacement parts, product support, or application guidance, contact ScienceLighting technical support. Warranty valid for 12 months.

Ordering

Have additional questions? Contact ScienceLighting at (650) 961-9031 or sales@sciencelighting.com.